Πληροφορίες μαθήματος

The aims of this unit is to develop the competencies of the students on the commonly used characterization techniques for solids materials. This course divided into three parts focuses on the main techniques used for chemical, structural and thermal characterizations of materials, to give a solid background on:

Part 1 (S. Daviero-Minaud): X-rays interactions with matter: diffraction, spectroscopic and emission methods for analysis of solids and microscopies techniques for images;

Part 2 (S. Duval): Basics of crystallography for X-ray diffraction and description of crystal structures

Part 3 (F. Mear): Thermal analysis measurements applicable to glasses, ceramics, polymers, etc., materials.